粉体行业在线展览
面议
254
Multilayers XS-55, XS-N, XS-C, XS-B
Multilayers are not natural crystals but artificially produced “layer analyzers.” The lattice plane distances d
are produced by applying thin layers of two materials in alternation onto a substrate (Fig. 18). Multilayers
are characterized by high reflectivity and a somewhat reduced resolution. For the analysis of light
elements the multilayer technique presents an almost revolutionary improvement for numerous
applications in comparison to natural crystals with large lattice plane distances.
Fig. 18: Diffraction in the layers of a multilayer crystal
XS-55:
The most commonly used multilayer with a 2d-value of 5.5 nm for analyzing the elements N to Al and Ca
to Br; standard application for measuring the elements F, Na and Mg.
TH-F120
在线折光仪PRB21
ParticleX TC
CELL PAT
OES1000
FS500全谱直读光谱仪
TD5
Nanocoulter
XRF2601
CM-017
NGI新一代药用圆盘撞击器摇床